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EI Nova NanoSEM 450 microscope SEM/XPS holder — image 1
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EI Nova NanoSEM 450 microscope SEM/XPS holder

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Simple holder for Scanning Electron Microscope

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"Introducing a sophisticated yet straightforward solution—a 3D printed holder designed for Scanning Electron Microscopes (SEMs). This innovative holder serves a crucial purpose: it facilitates direct electrical contact to safely discharge any residual charge from samples situated on the X-ray Photoelectron Spectroscopy (XPS) table within the SEM environment. By seamlessly integrating with the scanning electron microscope, it enables the concurrent application of two distinct surface analysis techniques on a single sample.

 

Requires conductive PLA material!!!

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